FURI | Spring 2024

Measuring Material Diffusion And Performance Changes in Semiconductor Diodes

FURI Semiconductor Research theme icon

The purpose of this research is to find a correlation between aging semiconductor diodes, the before and after performance, and the metal distribution through the diode. Aging of diode samples will be produced by heating the diodes in various temperatures. Performance will be taken into account by taking capacitance-voltage measurements. Metal diffusion will be measured by using a Glow Discharge – Optical Emission Spectrometer. The purpose is to find a new way to characterize semiconductor materials and degradation because this method of finding defects is unique from the typical approaches.

Student researcher

Daniel Eduardo Abreu

Electrical engineering

Hometown: Chandler, Arizona, United States

Graduation date: Spring 2024